A propagation delay time measuring method is provided that is capable of easily and accurately measuring propagation delay times Tb and Tc of a drive signal path BL1 connected between a driver DR1 and an I/O pin of an IC under test 119 and a response signal path BL2 connected between a comparator CP2...http://www.google.fr/patents/US6369601?utm_source=gb-gplus-shareBrevet US6369601 - Method of measuring a propagation delay time through a transmission path in a semiconductor integrated circuit testing apparatus and semiconductor integrated circuit testing apparatus using the same
Method of measuring a propagation delay time through a transmission path in ...
