Disclosed is a method of testing ultra large area integrated circuits. The circuit has a plurality of individually addressable elements. The method comprises providing a dispersed chargeable powder with the integrated circuit in proximity to and above the powder. At least one device of the integrated...http://www.google.fr/patents/US5008617?utm_source=gb-gplus-shareBrevet US5008617 - Functional testing of ultra large area, ultra large scale integrated circuits
Functional testing of ultra large area, ultra large scale integrated circuits
