A method for wiring IC chips such that electromigration criteria are met while minimizing the effect on overall chip wireability. A technique to optimize the width of automatically routed wire segments so that these widths are adequate to support the electromigration current on that net as a function...http://www.google.fr/patents/US5737580?utm_source=gb-gplus-shareBrevet US5737580 - Wiring design tool improvement for avoiding electromigration by determining optimal wire widths
Wiring design tool improvement for avoiding electromigration by determining ...
