A semiconductor device whose characteristics are highly reliably regulated for circuits whose desired characteristics need to be realized without being affect by unevenness in device characteristics is to be provided. A replica MOS transistor for amperage measurement connected to an external measuring...http://www.google.fr/patents/US20030016566?utm_source=gb-gplus-shareBrevet US20030016566 - Semiconductor device, microcomputer and flash memory
Semiconductor device, microcomputer and flash memory
Numéro de demande: 10/247,301 Numéro de publication: US 2003/0016566 A1 Date de dépôt: 20 sept. 2002 Brevet délivré: US6643193 ( Date de délivrance 4 nov. 2003)
