A process and apparatus for the non-destructive measurement of the thickness of sheets or hollow bodies made of dielectric materials, such as plactis, makes use of a microwave frequency signal which is fed to an elongated microwave strip line which is placed either close to, or in contact with, the material...http://www.google.fr/patents/US4520308?utm_source=gb-gplus-shareBrevet US4520308 - Process and device for the nondestructive measurement of material accumulations or coating thicknesses on dielectric materials, in particular plastic
Process and device for the nondestructive measurement of material ...
