In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a...http://www.google.fr/patents/US20060139048?utm_source=gb-gplus-shareBrevet US20060139048 - PIN ELECTRONICS WITH HIGH VOLTAGE FUNCTIONALITY
Numéro de demande: 11/023,023 Numéro de publication: US 2006/0139048 A1 Date de dépôt: 23 déc. 2004 Brevet délivré: US7102375 ( Date de délivrance 5 sept. 2006)
