A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model...http://www.google.fr/patents/US6985625?utm_source=gb-gplus-shareBrevet US6985625 - Fast high-accuracy multi-dimensional pattern inspection
Fast high-accuracy multi-dimensional pattern inspection
