Current is reduced in driving a word line in stress acceleration testing such as burn-in, and the time required for the stress acceleration testing is reduced. For an address signal applied from an address buffer, a predetermined internal address signal bit is degenerated and a remaining address signal...http://www.google.fr/patents/US6205067?utm_source=gb-gplus-shareBrevet US6205067 - Semiconductor memory device having burn-in mode operation stably accelerated
Semiconductor memory device having burn-in mode operation stably accelerated
