A compression test mode, independent of redundancy, for a memory device is disclosed. In one embodiment, a method for testing a memory array of a memory device includes outputting individually the output bits of a predetermined number of memory cells, upon failure of a compression mode. The cells may...http://www.google.fr/patents/US6202179?utm_source=gb-gplus-shareBrevet US6202179 - Method and apparatus for testing cells in a memory device with compressed data and for replacing defective cells
Method and apparatus for testing cells in a memory device with compressed ...
