A new method for masking off failing memory locations on a Single In-line Memory Module (SIMM) involves reading out identification (ID) codes fused in individual DRAMs. The ID codes are used to index stored fail maps taken from the DRAMs prior to their assembly onto a SIMM. After all failing locations...http://www.google.fr/patents/US6009536?utm_source=gb-gplus-shareBrevet US6009536 - Method for using fuse identification codes for masking bad bits on memory modules
Method for using fuse identification codes for masking bad bits on memory ...
