A condition analysis apparatus capable of grasping the condition of an object easily and accurately is provided. The condition analysis apparatus 1 includes a three-dimensional sensor 10 for measuring sampling-point-moves in the height direction of an object 2 existing in a target area at a plurality...http://www.google.fr/patents/US7545279?utm_source=gb-gplus-shareBrevet US7545279 - Condition-analyzing device
