Semiconductor nanocrystal probes for biological applications and process for ...

(21) Appl. No.: 09/259,982

(22) Filed: Mar. 1, 1999

Related U.S. Application Data

(63) Continuation-in-part of application No. 08/978,450, filed on Nov. 25, 1997, now Pat. No. 5,990,479.

(51) Int. CI.7 G01J 5/02; G01J 3/30;

F21V 4/16; H01J 65/06; C09K 11/06

(52) U.S. CI 435/7.1; 250/352; 250/459.1;

356/317; 422/82.08; 252/301.17; 378/47;

436/546; 436/6

(58) Field of Search 250/307, 459.1,

250/302; 356/317; 422/82.08; 252/301.17;

378/47; 436/546; 435/6, 7.1

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(List continued on next page.)

Primary Examiner—John S. Brusca
Assistant Examiner—Stephen Siu

(74) Attorney, Agent, or Firm—Paul R. Martin; Kerry S. Taylor; John F. Taylor

(57) ABSTRACT

A semiconductor nanocrystal compound is described which is capable of linking to one or more affinity molecules. The compound comprises (1) one or more semiconductor nanocrystals capable of, in response to exposure to a first energy, providing a second energy, and (2) one or more linking agents, having a first portion linked to the one or more semiconductor nanocrystals and a second portion capable of linking to one or more affinity molecules. One or more of these semiconductor nanocrystal compounds are linked to one or more affinity molecules to form a semiconductor nanocrystal probe capable of bonding with one or more detectable substances in a material being analyzed, and capable of, in response to exposure to a first energy, providing a second energy.

Treatment of a material with the semiconductor nanocrystal probe, and subsequent exposure of this treated material to a first energy, to determine the presence of the detectable substance within the material bonded to the probe, will excite the semiconductor nanocrystal in the probe bonded to the detectable substance, causing the probe to provide a second energy signifying the presence, in the material, of the detectable substance bonded to the semiconductor nanocrystal probe.

Also described are processes for respectively making the semiconductor nanocrystal compound and the semiconductor nanocrystal probe. Processes are also described for treating materials with the probe, for example, to determine the presence of a detectable substance in the material bonded to the probe.

155 Claims, 4 Drawing Sheets

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