(54) CARD FOR TESTING FUNCTIONS OF CARD INTERFACE
(75) Inventors: Jen-De Chen, Taoyuan (TW);
Yung-Ming Lu, Taoyuan (TW)
(73) Assignee: High Tech Computer Corp., Taoyuan (TW)
( * ) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 113 days.
(21) Appl. No.: 10/606,842
(22) Filed: Jun. 27, 2003
(65) Prior Publication Data
US 2004/0138848 Al Jul. 15, 2004
(30) Foreign Application Priority Data
Jan. 13, 2003 (TW) 92100644 A
(51) Int. CI.
G01R 35/00 (2006.01)
(52) U.S. CI 702/108; 702/120
(58) Field of Classification Search 702/108,
702/110,118, 120, 122; 710/14, 48, 58 See application file for complete search history.
4,618,920 A * 10/1986 Fox 363/37
4,888,585 A * 12/1989 Kamiya et al 340/10.34
A card for testing functions of the card interface of an electronic device is provided. The testing card includes a converting circuit, a latch circuit, a data processor, a signal generator, an oscillation combination circuit, and a reset circuit is provided. The converting circuit is coupled to the card interface. The latch circuit receives the data signal fed in from the card interface, latches the data signal and outputs it to the data processor afterwards. Having received the signal sent from the converting circuit and the latch circuit, the data processor is able to proceed with testing. The signal generator can output the mode selection signal and the interrupt signal to the card interface to test the functions of mode selection and interrupt signals. Furthermore, the oscillation combination circuit can generate a wait signal and feed the wait signal to the card interface for the wait test.
19 Claims, 4 Drawing Sheets
