A process of converting simulation data to test data used for testing an integrated circuit includes the steps of detecting a transition of state of the simulation data, extracting an event from the simulation data in response to the transition, and creating the test data in response to the event....http://www.google.fr/patents/US6721676?utm_source=gb-gplus-shareBrevet US6721676 - Testing of semiconductor device and a fabrication process of a semiconductor device including a testing process
Testing of semiconductor device and a fabrication process of a semiconductor ...
